DocumentCode :
2726180
Title :
Ordering and Elimination Based Component Learning Method
Author :
Pamudurthy, Sheetal Reddy ; Sekhar, C. Chandra
Author_Institution :
Dept. of CSE, IIT Madras, Chennai
fYear :
2009
fDate :
4-6 Feb. 2009
Firstpage :
99
Lastpage :
102
Abstract :
In this paper, we propose a component learning method to learn a set of Gaussian components that fit the given data distribution. An ordering and visualization technique called OPTICS and tests of multi normality are used in this method. We consider the applications of the proposed method to the tasks of classification and clustering. Here, the components are used to define a feature space to which the data points are transformed. In that feature space, classification is performed using linear support vector machines and clustering is performed using support vector clustering. The performance of the component learning method and its application to classification and clustering is demonstrated on synthetic datasets.
Keywords :
image classification; pattern clustering; support vector machines; Gaussian components; OPTICS; classification; clustering; data distribution; elimination based component learning method; linear support vector machines; ordering based component learning method; synthetic datasets; visualization technique; Data visualization; Gaussian distribution; Indium phosphide; Learning systems; Optical devices; Pattern recognition; Performance analysis; Support vector machine classification; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in Pattern Recognition, 2009. ICAPR '09. Seventh International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-3335-3
Type :
conf
DOI :
10.1109/ICAPR.2009.103
Filename :
4782751
Link To Document :
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