DocumentCode :
2726201
Title :
Using modern ANSI C development tools to increase productivity and ensure test and measurement application reliability
Author :
Kruger, Adri
Author_Institution :
Nat. Instrum., Austin, TX, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
3
Abstract :
Over the past few decades, the ANSI C language has become one of the most popular test and measurement programming languages due to its power and flexibility. ANSI C applications can be optimized for improved performance because of the developer´s ability to have low level control through direct access to memory and hardware specific function calls. Although the ANSI C language provides low level control of application development resulting in the freedom to optimize source code for improved execution performance, it can also lead to programming mistakes. Some examples of the most common ANSI C programming mistakes are syntax errors, incorrect array indexing, memory leaks and inefficient function implementation, which can cause sluggish execution speeds on deployed test systems. Unlike high-level language developers, ANSI C developers are challenged with the added responsibility of ensuring that low level details are handled appropriately in order to ensure that applications are reliable and stable. Modern tools are becoming available to help ANSI C developers face these challenges and, often, integrate directly into existing development environments. This paper examines how and why ANSI C developers commonly make programming mistakes related to syntax, memory allocation and inefficiencies in application source code, and focuses on overcoming these challenges with modern development tools. Some of these modern ANSI C development tools include run-time debugging, resource tracking and run-time analysis and help to increase developer productivity and ensure the reliability of test systems.
Keywords :
ANSI standards; C language; automatic test equipment; program debugging; software reliability; ANSI C language; direct access memory; hardware specific function call; incorrect array indexing; measurement application reliability; measurement programming language; memory leak; modern ANSI C development tool; programming mistake; resource tracking; run time analysis; run time debugging; source code optimization; syntax error; test application; Debugging; Hardware; Instruments; Level control; Productivity; Programming; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613623
Filename :
5613623
Link To Document :
بازگشت