DocumentCode
2726235
Title
PACO: A predictive analysis system for manufacturing test
Author
Jones, Timothy ; Engler, Joseph
Author_Institution
Adaptive Syst., Rockwell Collins, Inc., Cedar Rapids, IA, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
5
Abstract
Testing of products throughout the manufacturing process results in a vast amount of data which is often analyzed in a post process model. Analysis of this data is typically limited to standard Six Sigma or statistical process control methodologies. This form of analysis is susceptible to overlooking correlations between differing test configurations as well as other non-intuitive relationships within the data itself. Often, this analysis is performed too late in the testing process to affect the most beneficial change. Post processing of test data requires that complete testing be performed even though failures may occur during the testing process. This paper presents a predictive analysis system which analyzes test data in a near real-time environment. The presented Predictive Analysis Collaboration Object (PACO) receives real-time data from the testing system and performs data analysis against a constantly evolving rule set to offer rapid feedback to the appropriate personnel. Thus, the user has the ability to stop testing or prevent the unit from entering another test setup phase should faults be detected. Illustrated within this paper is the basic architecture of PACO along with the analysis algorithms which are currently utilized in the analysis. Additionally, a case study of PACO in use on a product under test at Rockwell Collins Inc. is given.
Keywords
data analysis; groupware; manufacturing data processing; manufacturing processes; production engineering computing; production testing; six sigma (quality); statistical process control; PACO predictive analysis system; Predictive Analysis Collaboration Object; Rockwell Collins Inc; Six Sigma; manufacturing process; manufacturing test; product testing; statistical process control; test configuration; test data analysis; test data post processing; testing process; Algorithm design and analysis; Assembly; Databases; Decision trees; Real time systems; Servers; Testing; predictive analysis; test data; test station;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613625
Filename
5613625
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