• DocumentCode
    2726297
  • Title

    Development of ultra dense edge interconnects for die to die connections based on immersion solder bridging

  • Author

    Chu, Dahwey ; Rohwer, Lauren E S

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1984
  • Lastpage
    1991
  • Abstract
    A high density 2-D integration process that involves linking multiple die along their edges using a linear array of solder bridges was explored. Solder bridging is a versatile approach that is compatible with a range of interconnect geometries and metallizations. We have demonstrated this approach using copper plated nodules that were fabricated on the surface of the die and extend beyond the edge of the die. These nodules were 25 microns (μm) thick with 10, 20, and 50 μm widths. The formation of solder bridges was accomplished using immersion soldering, where the entire part was dipped into a molten solder bath. Due to surface energy effects, the solder selectively wets and flows along all wettable metal surfaces to form a strong solder bond. The solder can even flow across gaps (15 microns).
  • Keywords
    copper; integrated circuit interconnections; integrated circuit metallisation; solders; surface energy; copper plated nodules; die to die connections; high density 2D integration process; immersion solder bridging; immersion soldering; interconnect geometries; linear array; metallizations; molten solder bath; size 10 mum; size 20 mum; size 25 mum; size 50 mum; solder bond; solder bridges; surface energy effects; ultra dense edge interconnects; wettable metal surfaces; Bridges; Copper; Integrated circuit interconnections; Metallization; Soldering; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249112
  • Filename
    6249112