• DocumentCode
    2726325
  • Title

    Design and fabrication of low-loss horizontal and vertical interconnect links using air-clad transmission lines and through silicon vias

  • Author

    Sharma, Rohit ; Uzunlar, Erdal ; Kumar, Vachan ; Saha, Rajarshi ; Yeow, Xinyi ; Bashirullah, Rizwan ; Naeemi, Azad ; Kohl, Paul

  • Author_Institution
    Interconnect Focus Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    2005
  • Lastpage
    2012
  • Abstract
    In this paper we present the design and fabrication of air-clad planar transmission lines and TSVs that can be used as horizontal and vertical chip-chip interconnects. Performance improvement by using heterogeneous air-clad dielectric is presented for these two types of interconnect structures that establishes the basic motivation for fabricating these structures. The design data is verified by performing simulation using 3D full-wave solver HFSS. We outline the process flow for air-clad transmission lines and TSVs in detail. Several challenges in the fabrication of air-clad structures are also discussed.
  • Keywords
    claddings; dielectric materials; integrated circuit design; integrated circuit interconnections; three-dimensional integrated circuits; transmission lines; 3D full-wave solver HFSS simulation; TSV; air-clad transmission line; heterogeneous air-clad dielectric; horizontal chip-chip interconnect link; through silicon vias; vertical chip-chip interconnect link; Copper; Dielectric losses; Fabrication; Gold; Integrated circuit interconnections; Polyimides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249115
  • Filename
    6249115