DocumentCode :
2726368
Title :
HLA-based parallel test grid simulation
Author :
Lei, Wang ; Yang-wang, Fang ; Xin, Xu ; Lei-gang, Hu
Author_Institution :
Eng. Sch., Air Force Eng. Univ., Xi´´an, China
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Reconfigured Parallel Test Grid (RPTG) technology advanced a novel theory to improve test and ATE using efficiency. In order to analyze the function and efficiency of RPTG, it is important to simulate the RPTG environment authentically. Based on parallel and reconfigured characteristic of RPTG, HLA-based layered analytic simulation architecture was put forward. This solution can exploit the parallelism of the analytic simulation applications and support them well; also test tasks could be distributed effectively and dynamically.
Keywords :
automatic testing; digital simulation; grid computing; parallel processing; ATE; HLA based parallel test grid simulation; analytic simulation applications; reconfigured parallel test grid technology; Analytical models; Computational modeling; Computer architecture; Computers; Schedules; Software; Test equipment; HLA; High-performance Simulation; Parallel Processing; RPTG;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613631
Filename :
5613631
Link To Document :
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