Title :
ESD measurements and corrective actions for integrated circuits (IC) lead inspection/handling systems
Author :
Soto, Albert ; De Lage, Jack
Author_Institution :
MOS Digital analog Motorola, Austin, TX, USA
Abstract :
Charge generating source on an integrated circuit (IC) lead scanner was identified using a fast response electrostatic voltmeter in conjunction with storage oscilloscope and plotter. Alternative low tribo-charging material was used in this pick and place equipment to provide an ESD safe handling environment for the IC.
Keywords :
electrostatic discharge; inspection; integrated circuit manufacture; surface charging; ESD measurements; ESD safe handling environment; IC lead inspection; charge generating source; corrective actions; fast response electrostatic voltmeter; integrated circuits; lead inspection/handling systems; lead scanner; low tribo-charging material; pick/place equipment; Electrostatic discharge; Electrostatic measurements; Integrated circuit measurements; Oscilloscopes; Voltmeters;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
1-878303-59-7
DOI :
10.1109/EOSESD.1995.478277
