• DocumentCode
    2726625
  • Title

    Multi-scale image segmentation algorithm based on SPCNN and contourlet

  • Author

    Chen, Dongfang ; Xu, Tao

  • Author_Institution
    Coll. of Comput. Sci. & Technol., Wuhan Univ. of Sci. & Technol., Wuhan, China
  • Volume
    4
  • fYear
    2009
  • fDate
    20-22 Nov. 2009
  • Firstpage
    435
  • Lastpage
    439
  • Abstract
    A new multi-scale image segmentation algorithm based on nonsubsampled contourlet transform (NSCT) and simplified plus coupled neural network (SPCNN) has been discussed in this paper. Comparing with plus coupled neural network (PCNN), the SPCNN algorithm can decrease the complexity of adjusting parameters significantly. First we combine susan edge detector with SPCNN, more accurate result can be obtained. Then we use SPCNN to deal with the low-frequency coefficients of NSCT, and then the running time will be shortened remarkably. In order to solve the problem that the details of the image will be fuzzed because of losing high-frequency coefficients of NSCT, we preserve the edge information in corresponding high-frequency coefficients by detecting the edge of origin image. Finally, we use maximum mutual information (MMI) to determine optimal results by SPCNN. The test results prove the rationality of this method and show efficiency and accuracy to a certain extent.
  • Keywords
    edge detection; image segmentation; neural nets; transforms; maximum mutual information; multiscale image segmentation algorithm; nonsubsampled contourlet transform; simplified plus coupled neural network; susan edge detector; Detectors; Filter bank; Frequency estimation; Image edge detection; Image resolution; Image segmentation; Laplace equations; Mutual information; Neural networks; Spatial resolution; Nonsubsampled contourlet transform; maximum mutual information; pcnn; susan edge detector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-4754-1
  • Electronic_ISBN
    978-1-4244-4738-1
  • Type

    conf

  • DOI
    10.1109/ICICISYS.2009.5357651
  • Filename
    5357651