Title :
Impact of Asymmetric Channel Configuration on the Linearity of Double-Gate SOI MOSFETs
Author :
Pavanello, Marcelo Antonio ; Cerdeira, Antonio ; Martino, João Antonio ; Raskin, Jean-Pierre ; Flandre, Denis
Author_Institution :
Departamento de Engenharia Eletrica, Centro Universitario da FEI, Sao Bernardo do Campo
Abstract :
In this paper the linearity of asymmetric channel double-gate transistors, using the graded-channel (GC) configuration and gate-all-around architecture, operating as an amplifier, is studied in terms of lightly doped region length. The total harmonic distortion and third-order harmonic distortion are used as figures of merit. The results are compared with single-gate transistors with similar channel configuration. It is demonstrated that double-gate GC transistors at the same operation region and with similar channel configuration can present up to 20 dB less total harmonic distortion while presenting small third-order harmonic distortion. Considering similar bias voltage, the alternate component of the input sinusoidal signal of GC double-gate devices can be increased by about 200 mV to provide similar third-order harmonic distortion maintaining similar improvements of 20 dB on the total harmonic distortion
Keywords :
MOSFET; harmonic distortion; semiconductor doping; silicon-on-insulator; amplifier; asymmetric channel configuration; double-gate SOI MOSFET; gate-all-around architecture; graded-channel configuration; harmonic distortion; single-gate transistors; Circuits; Cryogenics; Doping; Harmonic distortion; Intrusion detection; Linearity; MOSFETs; Temperature; Total harmonic distortion; Transconductance; Linearity; MOSFET; double gate; harmonic distortion;
Conference_Titel :
Devices, Circuits and Systems, Proceedings of the 6th International Caribbean Conference on
Conference_Location :
Playa del Carmen
Print_ISBN :
1-4244-0041-4
Electronic_ISBN :
1-4244-0042-2
DOI :
10.1109/ICCDCS.2006.250859