• DocumentCode
    2727316
  • Title

    An effective photoplethysmography signal processing system based on EEMD method

  • Author

    Jia-Ju Liao ; Shang-Yi Chuang ; Chia-Ching Chou ; Chia-Chi Chang ; Wai-Chi Fang

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This study proposed an effective signal processing system based on Ensemble Empirical Mode Decomposition (EEMD) method for the analysis of Photoplethysmography (PPG). The whole system was implemented on an ARM-based SoC development platform to attain the on-line non-stationary signal processing. A non-invasive near-infrared light sensing device was used to record the continuous PPG as the input signal. According to the non-stationary characteristics of PPG, EEMD is useful to achieve accurate analysis for PPG. The signal was decomposed into several Intrinsic Mode Functions (IMFs) by EEMD. The results showed that the proposed EEMD processor can effectively solve the mode mixing problem of Empirical Mode Decomposition (EMD). This study examined its possibility based on specific architecture with an on-board Xilinx FPGA. It was helpful for non-stationary biomedical signal processing and cardiovascular diseases research.
  • Keywords
    cardiovascular system; diseases; medical signal processing; optical sensors; photoplethysmography; ARM-based SoC development; EEMD method; IMF; cardiovascular diseases; ensemble empirical mode decomposition; intrinsic mode functions; noninvasive near-infrared light sensing device; nonstationary biomedical signal processing; on-board Xilinx FPGA; on-line non-stationary signal processing; photoplethysmography signal processing system; Band-pass filters; Empirical mode decomposition; Engines; Hardware; Splines (mathematics); White noise; FPGA; ensemble empirical mode decomposition; photoplethysmography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2015.7114498
  • Filename
    7114498