Improving a 3 Data-Source Diagnostic Method

In this paper, we present improvements to a diagnosis method for bridging faults combining three different data sources. The first data source is a set of I_DDQ measurements used to identify the most probable fault type. The second source is a list of parasitic capacitances extracted from layout and used to create a list of realistic potential bridging fault sites. The third source is logical faults detectable at the primary outputs (including scan flip flops), used to limit the number of suspected gates. Combining these data significantly reduces the number of potential fault sites to consider in the diagnosis process. The modifications proposed in this paper allow the technique to be even more suitable for very large devices. Results obtained with different circuits are provided