• DocumentCode
    2727605
  • Title

    k nearest neighbors in search of a metric

  • Author

    Snapp, Robert R. ; Venkatesh, Santosh S.

  • Author_Institution
    Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
  • fYear
    1995
  • fDate
    17-22 Sep 1995
  • Firstpage
    256
  • Abstract
    The finite-sample risk of the k-nearest neighbor classifier that uses a weighted Lp metric as a measure of class similarity is examined. For a family of multiclass, classification problems with smooth distributions in Rn, the risk is represented as an asymptotic expansion in decreasing fractional powers of the reference sample size. An analysis of the leading coefficients reveals that the optimal metric (i.e., the metric that minimizes the risk) tends to a weighted Euclidean (i.e., L2) metric as the sample size is increased. Numerical calculations corroborate this finding
  • Keywords
    pattern classification; random processes; asymptotic expansion; class similarity; finite-sample risk; k-nearest neighbor classifier; metric; multiclass classification problem; optimal metric; reference sample size; smooth distributions; weighted Euclidean metric; Computer science; Costs; Electric variables measurement; Laboratories; Nearest neighbor searches; Random processes; Risk analysis; Symmetric matrices; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 1995. Proceedings., 1995 IEEE International Symposium on
  • Conference_Location
    Whistler, BC
  • Print_ISBN
    0-7803-2453-6
  • Type

    conf

  • DOI
    10.1109/ISIT.1995.535771
  • Filename
    535771