Title :
Electro Optical Terahertz Pulse Reflectometry — an innovative fault isolation tool
Author :
Cai, Yongming ; Wang, Zhiyong ; Dias, Rajen ; Goyal, Deepak
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
Electro Optical Terahertz Pulse Reflectometry (EOTPR), an innovative time domain reflectometry (TDR) system, has been successfully developed. This is the first system that applies terahertz technology to time domain reflectometry. The system has achieved 10 um resolution, 5.7ps rise time, 94dB signal/noise ratio and 150 mm testing range and it has been successfully integrated into fault isolation and failure analysis process flow.
Keywords :
Failure analysis; Isolation technology; Optical noise; Optical pulses; Reflectometry; Signal processing; Signal resolution; Signal to noise ratio; Submillimeter wave technology; System testing;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490646
