DocumentCode
2728237
Title
12th IEEE European Test Symposium - Title page
fYear
2007
fDate
20-24 May 2007
Abstract
The following topics are dealt: fault and defect diagnosis; mixed signal DFT and test; NOC testing; RF test; diagnosis and debugging; circuit simulation and verification; memory test; on-line testing; self-testing; fault grading and test quality; diagnosis and yield improvement; single event upsets; BIST; and delay and performance test.
Keywords
automatic testing; built-in self test; circuit simulation; delays; design for manufacture; design for testability; fault diagnosis; inspection; integrated circuit design; integrated circuit testing; integrated circuit yield; integrated memory circuits; mixed analogue-digital integrated circuits; network-on-chip; performance evaluation; radiation hardening (electronics); radiofrequency integrated circuits; BIST; NOC testing; RF test; circuit simulation; circuit verification; debugging; defect diagnosis; delay test; fault diagnosis; fault grading mechanism; memory test; mixed signal DFT; on-line testing; performance test; self-testing; single event upsets; test quality; yield improvement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2007. ETS '07. 12th IEEE European
Conference_Location
Freiburg
Print_ISBN
0-7695-2827-9
Type
conf
DOI
10.1109/ETS.2007.4
Filename
4221556
Link To Document