• DocumentCode
    2728358
  • Title

    Modified real-value negative selection algorithm and its application on fault diagnosis

  • Author

    Li, Y.F. ; Chang, G.H. ; Zhang, C.J. ; Liang, S.H.

  • Author_Institution
    Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan, China
  • fYear
    2011
  • fDate
    15-17 July 2011
  • Firstpage
    216
  • Lastpage
    219
  • Abstract
    Analyze the drawbacks of common real-value negative selection algorithm applied on fault diagnosis, and the modified real-value negative selection algorithm is presented based on the corresponding innovations. Firstly, the fault detector set is partitioned into remember-detector set covering known-fault space and random-detector set covering unknown-fault space. Secondly, taking all known states including normal state as self set in training period, get the random-detector set through negative selection and distribution optimization. Lastly, in order to avoid `Fail to Alarm´ event caused by the Hole, the two-time-matching method is presented in detecting period which takes the normal state as self set. A resistance circuit fault diagnosis experiment shows that compared with the common real-value negative selection algorithm, the modified real-value negative algorithm can effectively avoid `Fail to Alarm´ event, and has higher diagnostic accuracy.
  • Keywords
    artificial immune systems; fault diagnosis; distribution optimization; fail to alarm event; fault detector set; modified real value negative algorithm; modified real value negative selection algorithm; random detector set; real value negative selection algorithm; remember detector set; resistance circuit fault diagnosis experiment; two time matching method; unknown fault space; Circuit faults; Detectors; Fault detection; Fault diagnosis; Immune system; Testing; Training; Artificial Immune System; Fault Diagnosis; Negative Selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Service Science (ICSESS), 2011 IEEE 2nd International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-9699-0
  • Type

    conf

  • DOI
    10.1109/ICSESS.2011.5982293
  • Filename
    5982293