Title :
Impact of Technology Scaling on the Performance of All-Time-On Single-Ended CMOS Logic
Author :
Abdalla, Y.S. ; Elmasry, M.I.
Abstract :
A qualitative analysis of the impact of technology scaling on the performance of all-time-on single-ended CMOS logic and MOS current mode logic (MCML) is presented. The analysis explains that the all-time-on CMOS single-ended logic is a strong competent to MCML at high speeds in current technology and also in future technology generations. Simulation results of a 4:1 MUX and a 1:4 DEMUX designed using either design techniques in different technology generations are provided in order to elucidate the impact of technology generations on the performance of either design techniques
Keywords :
CMOS logic circuits; MOS logic circuits; current-mode logic; demultiplexing equipment; multiplexing equipment; 1:4 DEMUX; 4:1 MUX; MOS current mode logic; all-time-on single-ended CMOS logic; digital circuits; qualitative analysis; technology scaling; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Circuit simulation; Clocks; Digital circuits; Latches; Logic design; Switches; Timing; All-Time-On; CMOS; Digital circuits; Technology Scaling;
Conference_Titel :
Circuits and Systems, 2006 IEEE North-East Workshop on
Conference_Location :
Gatineau, Que.
Print_ISBN :
1-4244-0416-9
Electronic_ISBN :
1-4244-0417-7
DOI :
10.1109/NEWCAS.2006.250941
