Title :
Effects of corner and edgebond epoxy adhesives on board level solder joint reliability of BGA mezzanine connectors
Author :
Song, Fubin ; Yang, Chaoran ; Wu, H. L Henry ; Lo, C. C Jeffery ; Lee, S. W Ricky ; Newman, Keith
Author_Institution :
EPACK Lab., Hong Kong Univ. of Sci.&Technol., Hong Kong, China
Abstract :
In this paper, the button shear tests of seven kinds of epoxy used for corner/edge bonding of BGA mezzanine connectors are performed firstly for determining adhesive strength between the epoxies and each relevant surface material. The effect of corner/edge bonding epoxy on the board level solder joint reliability of BGA connectors is also investigated including mechanical drop and 4-point bending tests. In addition, the pre-conditioning effect of thermal aging (1000 hours at 125°C) and accelerated temperature cycling (ATC, −40~125°C, 500 cycles) on the reliability of connectors with corner/edge bonding epoxy is discussed. The failure modes and fracture strengths of the button shear and boardlevel tests are cross-referenced for comparison and assessed for correlation. The results from the present study not only contribute to the characterization and selection of corner/edge bonding epoxies for BGA connectors, but also improve the understanding of the corresponding relationship between simple button shear and the more complex and costly boardlevel reliability tests.
Keywords :
Adhesive strength; Aging; Assembly; Bonding processes; Chaos; Connectors; Materials reliability; Materials testing; Packaging; Soldering;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490668