• DocumentCode
    2728424
  • Title

    Programmable mixed-voltage sensor readout circuit and bus interface with built-in self-test

  • Author

    Chavan, A.V. ; Mason, Alex ; Kang, U. ; Wise, K.D.

  • Author_Institution
    Delphi Delco Electron. Corp., Kokomo, IN, USA
  • fYear
    1999
  • fDate
    17-17 Feb. 1999
  • Firstpage
    136
  • Lastpage
    137
  • Abstract
    As integrated sensors and microactuators are combined with embedded microcontrollers to form microsystems, there is an increasing need for highly-accurate interface circuits to provide the transducers with bus compatibility, programmable control, and self-test. Several readout circuits for capacitive sensors have been reported recently, including a generic interface that has been used extensively in a multi-element microsystem. This paper reports a bus-compatible interface chip that introduces several additional features, including a programmable mixed-signal mixed-voltage switched-capacitor (SC) read-out circuit with self-test and on-line calibration capabilities. This 4.5/spl times/4.5 mm/sup 2/ chip is in a 1 /spl mu/m n-well BiCMOS 2P/2M process with high-voltage CMOS, large-value resistor, and nonvolatile memory options.
  • Keywords
    BiCMOS integrated circuits; built-in self test; calibration; capacitive sensors; embedded systems; microcontrollers; mixed analogue-digital integrated circuits; programmable circuits; readout electronics; switched capacitor networks; 1 micron; built-in self-test; bus compatibility; bus interface; capacitive sensors; embedded microcontrollers; integrated sensors; n-well BiCMOS 2P/2M process; nonvolatile memory options; on-line calibration; programmable control; programmable mixed-voltage circuit; sensor readout circuit; switched-capacitor circuit; BiCMOS integrated circuits; Built-in self-test; CMOS process; Calibration; Capacitive sensors; Microactuators; Microcontrollers; Programmable control; Switching circuits; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1999. Digest of Technical Papers. ISSCC. 1999 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-5126-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.1999.759163
  • Filename
    759163