Title :
Redefining the Role of Functional Testing
Author :
Thibeault, C. ; Tremblay, D. ; Hariri, Y.
Author_Institution :
Dept. of Electr. Eng., Ecole de Technologie Superieure, Montreal, Que.
Abstract :
In this paper, we propose a new role for functional testing. We show that it can be used to optimize test sets in terms of test time and automated test equipment (ATE) memory resources, or to increase coverage. We also propose to ease the generation of functional test patterns, by reusing data sequences initially generated with system-level tools for validation purposes
Keywords :
automatic test equipment; automatic test pattern generation; automated test equipment; data sequences reduction; functional test patterns; functional testing; system-level tools; Automatic testing; CMOS technology; Circuit testing; Cost function; Fault detection; Logic testing; Quality management; System testing; Test equipment; Test pattern generators;
Conference_Titel :
Circuits and Systems, 2006 IEEE North-East Workshop on
Conference_Location :
Gatineau, Que.
Print_ISBN :
1-4244-0416-9
Electronic_ISBN :
1-4244-0417-7
DOI :
10.1109/NEWCAS.2006.250947
