Title :
Low-skew clock generator with dynamic impedance and delay matching
Author :
Balatsos, A. ; Lewis, David
Author_Institution :
ATI Technol., Thornhill, Ont., Canada
Abstract :
High-speed digital systems on printed circuit boards require low-skew system clock distribution. Previous approaches track fabrication variations in the PC board, but use two traces for each clock to measure round trip delay, or do not dynamically track, both impedance and delay. This clock chip uses both an impedance locked loop (ILL) and a delay locked loop (DLL) for each clock that is generated. Time domain reflectometry dynamically tracks the impedance and delay of the clock wire. Dynamic tracking maintains clock quality in the presence of process and environmental variations such as V/sub dd/ and temperature.
Keywords :
clocks; delay lock loops; pulse generators; time-domain reflectometry; clock quality; delay locked loop; delay matching; dynamic impedance; environmental variations; impedance locked loop; low-skew clock generator; printed circuit boards; process variations; time domain reflectometry; Clocks; Delay effects; Digital systems; Fabrication; Impedance measurement; Printed circuits; Reflectometry; Semiconductor device measurement; Temperature; Wire;
Conference_Titel :
Solid-State Circuits Conference, 1999. Digest of Technical Papers. ISSCC. 1999 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5126-6
DOI :
10.1109/ISSCC.1999.759183