DocumentCode
2728742
Title
Low-skew clock generator with dynamic impedance and delay matching
Author
Balatsos, A. ; Lewis, David
Author_Institution
ATI Technol., Thornhill, Ont., Canada
fYear
1999
fDate
17-17 Feb. 1999
Firstpage
182
Lastpage
183
Abstract
High-speed digital systems on printed circuit boards require low-skew system clock distribution. Previous approaches track fabrication variations in the PC board, but use two traces for each clock to measure round trip delay, or do not dynamically track, both impedance and delay. This clock chip uses both an impedance locked loop (ILL) and a delay locked loop (DLL) for each clock that is generated. Time domain reflectometry dynamically tracks the impedance and delay of the clock wire. Dynamic tracking maintains clock quality in the presence of process and environmental variations such as V/sub dd/ and temperature.
Keywords
clocks; delay lock loops; pulse generators; time-domain reflectometry; clock quality; delay locked loop; delay matching; dynamic impedance; environmental variations; impedance locked loop; low-skew clock generator; printed circuit boards; process variations; time domain reflectometry; Clocks; Delay effects; Digital systems; Fabrication; Impedance measurement; Printed circuits; Reflectometry; Semiconductor device measurement; Temperature; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1999. Digest of Technical Papers. ISSCC. 1999 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
0-7803-5126-6
Type
conf
DOI
10.1109/ISSCC.1999.759183
Filename
759183
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