DocumentCode
2728967
Title
On the suitability of Gallium-Nitride (GaN) based automotive power electronics
Author
Dargahi, S. ; Williamson, Sheldon S.
Author_Institution
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
fYear
2010
fDate
1-3 Sept. 2010
Firstpage
1
Lastpage
6
Abstract
This paper aims at discussing the possibility of using GaN power devices in automotive power electronics applications. The major issues with current silicon-based devices are highlighted in this paper. Furthermore, the paper also discusses the possible solutions offered by wide-band gap semiconductors, specifically Gallium-Nitride (GaN). The fundamental steps in designing GaN devices includes choosing the substrate, the dimensions of each layer, the length of gate, drain, source, and the distance between them, selecting materials for contacts, and finally, optimizing passivation layer. Moreover, to achieve higher breakdown voltages, field plate technology has to be executed. High voltage, high current, and high temperature operation of previously fabricated GaN devices are studied and summarized. It can be concluded that GaN definitely has the potential to dominate the next generation of automotive power electronic systems. However, certain issues, such as normally-off and vertical operation have to be thoroughly elucidated.
Keywords
III-V semiconductors; automotive electronics; gallium compounds; high electron mobility transistors; passivation; power semiconductor devices; semiconductor device metallisation; wide band gap semiconductors; GaN; automotive power electronics; breakdown voltage; contact material; field plate technology; high current operation; high temperature operation; high voltage operation; passivation layer; wide band gap semiconductor; Gallium nitride; HEMTs; Logic gates; Passivation; Silicon; Substrates; Automotive applications; electric vehicles; power electronics; semiconductors; vehicular power systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicle Power and Propulsion Conference (VPPC), 2010 IEEE
Conference_Location
Lille
Print_ISBN
978-1-4244-8220-7
Type
conf
DOI
10.1109/VPPC.2010.5729180
Filename
5729180
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