Title :
A wavelet network approach for predicting surface cracks shapes
Author :
Ravan, M. ; Sadeghi, S.H.H. ; Moini, R.
Author_Institution :
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
Abstract :
A wavelet network based technique is proposed for predicting crack depth profile using the output signal of a surface magnetic field measurement (SMFM) probe. The technique utilizes a wavelet network with Gaussian-derivative activation function. The main feature of this technique is that it requires only the sensor output signals along the crack edge. The learning process is done using the estimated probe output signals from a simulator. The application of the proposed technique to several surface cracks with various depth profiles demonstrates its ability to accurately predict the crack shape, in addition, the results indicate that the proposed technique is superior to a conventional multiplayer perceptron neural network.
Keywords :
Gaussian processes; magnetic field measurement; neural nets; nondestructive testing; surface cracks; surface magnetism; wavelet transforms; Gaussian-derivative activation function; crack depth profile; learning process; surface crack shape prediction; surface magnetic field measurement probe; wavelet network; Artificial neural networks; Fatigue; Frequency; Magnetic field measurement; Magnetic sensors; Probes; Shape; Signal processing; Surface cracks; Surface waves;
Conference_Titel :
Industrial Electronics Society, 2003. IECON '03. The 29th Annual Conference of the IEEE
Print_ISBN :
0-7803-7906-3
DOI :
10.1109/IECON.2003.1280594