Title :
Third order non linear optical properties of ZnO:Al thin films prepared by spray pyrolysis
Author :
Bahedi, K. ; Addou, M. ; Jouad, M. El ; Sofiani, Z. ; Bayoud, S. ; Bouaouda, M. ; Sahraoui, B. ; Essaïdi, Z.
Author_Institution :
Lab. Optoelectron. et Physico-chimie des Mater., Univ. Ibn Tofail, Kenitra, Morocco
fDate :
June 28 2009-July 2 2009
Abstract :
In this study, zinc oxide (ZnO) and aluminium doped zinc oxide (ZnO:Al) thin films were deposited by reactive chemical pulverization spray pyrolysis technique on heated glass substrates at 450degC. X-ray diffraction (XRD), scanning electron microscopy (SEM) and third harmonic generation (THG) are used to characterize their structure , morphology and nonlinear optical properties as a function of Al concentration (0, 3, 5, 7 at %). The intensity of third order non linear optical susceptibility increase by incorporation of aluminium. A strong value of susceptibility chi(3) was found for films with a good crystallinity.
Keywords :
II-VI semiconductors; X-ray diffraction; aluminium; doping profiles; nonlinear optical susceptibility; pyrolysis; scanning electron microscopy; semiconductor doping; semiconductor growth; semiconductor thin films; spray coating techniques; wide band gap semiconductors; zinc compounds; Al concentration; SiO2; X-ray diffraction; ZnO; ZnO:Al; aluminum doped zinc oxide thin films; crystallinity; heated glass substrates; nonlinear optical susceptibility; reactive chemical pulverization; scanning electron microscopy; spray pyrolysis; temperature 450 degC; third harmonic generation; third order nonlinear optical properties; zinc oxide thin films; Aluminum; Electron optics; Nonlinear optics; Optical films; Optical harmonic generation; Optical microscopy; Scanning electron microscopy; Spraying; Sputtering; Zinc oxide; Al; Spray pyrolysis; THG; Thin films; ZnO;
Conference_Titel :
Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on
Conference_Location :
Azores
Print_ISBN :
978-1-4244-4825-8
Electronic_ISBN :
978-1-4244-4827-2
DOI :
10.1109/ICTON.2009.5185153
