Thermal stability of the dielectric properties of the low-loss, organic material RT/duroid 6002 from 30 GHz to 70 GHz

For the first time, the thermal stability of the dielectric properties, i.e. the relative permittivity and the loss tangent, are presented for RT/duroid^® 6002 from 30 GHz to 70 GHz over the temperature range between 20°C and 200°C, using the microstrip ring resonator method at two different microstrip impedances. High-frequency-resolution, Multiline TRL calibrations were performed at each temperature point to increase the accuracy of the measurements. Measurements show a remarkably-stable normalized temperature coefficient of the relative permittivity of -17.6 ppm/°C across the entire bandwidth. Likewise, the normalized loss tangent temperature coefficient had a value of about 0.00118°C^-1, with little variations throughout the measurement bandwidth.