• DocumentCode
    2729512
  • Title

    Advanced Test Methodology and Strategies for Semiconductors

  • Author

    West, Burnell G.

  • Author_Institution
    Credence Syst., Milpitas, CA
  • fYear
    2006
  • fDate
    3-7 July 2006
  • Firstpage
    119
  • Lastpage
    124
  • Abstract
    The seemingly relentless progress of Moore´s law recently transformed the basic nature of semiconductor test. Today the focus on the high-end devices is evolving from precise measurement to data management. A transaction-based ATE architecture is therefore described
  • Keywords
    automatic test equipment; integrated circuit testing; Moore law; advanced test methodology; automatic test equipment; high end devices; semiconductors strategies; Boolean functions; Circuit testing; Computer architecture; Degradation; Integrated circuit interconnections; Lifting equipment; Logic devices; Quality assurance; Semiconductor device testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0205-0
  • Electronic_ISBN
    1-4244-0206-9
  • Type

    conf

  • DOI
    10.1109/IPFA.2006.251011
  • Filename
    4017036
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2729512