DocumentCode
2730119
Title
Terahertz packaging: Study of substrates for novel component designs
Author
Hejase, Jose A. ; Paladhi, Pavel R. ; Chahal, Prem
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
2010
fDate
1-4 June 2010
Firstpage
744
Lastpage
751
Abstract
This paper will examine a new side to packaging: Terahertz (THz) Packaging. The goal of this paper is three fold: 1) characterizing dielectric materials for THz packaging applications; 2) Using these materials in the fabrication of THz passives (integrated and quasi-optical); and 3) Demonstrating non-destructive evaluation of packages using THz. In this manuscript, detailed characteristics of dielectric packaging materials in the THz spectral region are presented along with the theory used for the characterization procedure. THz non destructive evaluation (NDE) of electronics packages is observed in the form of delamination thickness detection and moisture content studies. Using the materials characterized, a planar THz power splitter and a quasi-optical THz bandstop interference filter are demonstrated. Furthermore, the power splitter is used as a THz microfluidic sensor.
Keywords
Delamination; Dielectric materials; Dielectric substrates; Electronics packaging; Fabrication; Filters; Interference; Microfluidics; Moisture; Sensor phenomena and characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490763
Filename
5490763
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