DocumentCode
2730327
Title
Temperature dependence of thin film spiral inductors on Alumina over a temperature range of 25 to 475° C
Author
Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian C.
Author_Institution
NASA Glenn Res. Center, Cleveland, OH, USA
fYear
2010
fDate
1-4 June 2010
Firstpage
713
Lastpage
719
Abstract
In this paper, we present an analysis of inductors on an Alumina substrate over the temperature range of 25 to 475° C. Five sets of inductors, each set consisting of a 1.5, 2.5, 3.5, and a 4.5 turn inductor with different line width and spacing, were measured on a high temperature probe station from 10 MHz to 30 GHz. From these measured characteristics, it is shown that the inductance is nearly independent of temperature for low frequencies compared to the self resonant frequency, the parasitic capacitances are independent of temperature, and the resistance varies nearly linearly with temperature. These characteristics result in the self resonant frequency decreasing by only a few percent as the temperature is increased from 25 to 475° C, but the maximum quality factor decreases by a factor of 2 to 3. These observations based on measured data are confirmed through 2D simulations using Sonnet software.
Keywords
Capacitance measurement; Electrical resistance measurement; Inductance measurement; Probes; Resonant frequency; Spirals; Substrates; Temperature dependence; Temperature distribution; Thin film inductors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490775
Filename
5490775
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