• DocumentCode
    2730327
  • Title

    Temperature dependence of thin film spiral inductors on Alumina over a temperature range of 25 to 475° C

  • Author

    Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian C.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    713
  • Lastpage
    719
  • Abstract
    In this paper, we present an analysis of inductors on an Alumina substrate over the temperature range of 25 to 475° C. Five sets of inductors, each set consisting of a 1.5, 2.5, 3.5, and a 4.5 turn inductor with different line width and spacing, were measured on a high temperature probe station from 10 MHz to 30 GHz. From these measured characteristics, it is shown that the inductance is nearly independent of temperature for low frequencies compared to the self resonant frequency, the parasitic capacitances are independent of temperature, and the resistance varies nearly linearly with temperature. These characteristics result in the self resonant frequency decreasing by only a few percent as the temperature is increased from 25 to 475° C, but the maximum quality factor decreases by a factor of 2 to 3. These observations based on measured data are confirmed through 2D simulations using Sonnet software.
  • Keywords
    Capacitance measurement; Electrical resistance measurement; Inductance measurement; Probes; Resonant frequency; Spirals; Substrates; Temperature dependence; Temperature distribution; Thin film inductors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490775
  • Filename
    5490775