DocumentCode :
2730614
Title :
High quality erbium doped tellurite glass films using ultrafast laser deposition
Author :
Jose, Gin ; Steenson, D.P. ; Irannejad, Mehrdad ; Jha, Animesh
Author_Institution :
Inst. for Mater. Res., Univ. Leeds, Leeds, UK
fYear :
2009
fDate :
June 28 2009-July 2 2009
Firstpage :
1
Lastpage :
4
Abstract :
Ultrafast laser ablation has been used successfully to grow glass thin films from bulk glass targets. The laser frequency, laser energy, process gas pressure, substrate temperature, substrate distance and substrate temperature where optimized to obtain highly transparent glass films of Er3+-doped tellurite glass. An empirical approach was followed to optimize the deposition parameters for the film fabrication. The ultrafast laser ablation procedure developed in the present work to fabricate oxide glass films would certainly overcome many deficiencies of the existing methods in producing high optical quality required photonic applications.
Keywords :
glass; high-speed optical techniques; pulsed laser deposition; bulk glass targets; highly transparent glass films; laser energy; laser frequency; process gas pressure; substrate distance; substrate temperature; tellurite glass films; ultrafast laser ablation; ultrafast laser deposition; Erbium; Frequency; Gas lasers; Glass; Laser ablation; Optical device fabrication; Optical films; Substrates; Temperature; Transistors; erbium doped tellurite glass; femtosecond laser ablation; pulsed laser deposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on
Conference_Location :
Azores
Print_ISBN :
978-1-4244-4825-8
Electronic_ISBN :
978-1-4244-4827-2
Type :
conf
DOI :
10.1109/ICTON.2009.5185229
Filename :
5185229
Link To Document :
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