DocumentCode
2730638
Title
Van der Waals and ideal gas models for compressibility by means of pressure in pneumatic pipes from 1 to 100 Lpm
Author
Vassallo, Carlos A Mugruza
Author_Institution
Sao Paulo Univ., Brazil
Volume
1
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
2034
Lastpage
2037
Abstract
The general aim is to develop a Venturi flow sensor for the inspiration line to be used in mechanical ventilation. This work is an advance for the development and construction of this sensor and to explain some of its characteristics in mechanical ventilation. The Mach number in this sensor grows with the pipe diameter, but it is less than 0.3 to diameters higher than 3mm, and according to the traditional bibliography it can be used as incompressible fluid for the design. For this reason the simulations were done between 2:1 and 6:1 to simulation pressures from 15 to 16.5 Psi (mechanical ventilation range). The results of these simulations are: it needs to consider the gas compressibility levels for Mach numbers smaller than 0.3 because the error of flow measure can be between 5 and 15% for the pattern of ideal gas and enter 7.5 to 20% for the Van Der Waals model above the incompressibility pattern, and these results were used for the construction of the small reduction the Venturi´s pipe from 3 to 78 Lpm, taken from absolute pressure to complete the norm ISO9360.
Keywords
Mach number; compressibility; flow measurement; flow simulation; pipes; sensors; van der Waals forces; ventilation; 15 to 16.5 psi; Mach number; Van der Waals model; Venturi flow sensor; gas compressibility; ideal gas model; mechanical ventilation; pneumatic pipes; Biosensors; Density estimation robust algorithm; Equations; Fluid flow measurement; Gases; Mechanical sensors; Pressure measurement; Prototypes; Sensor phenomena and characterization; Ventilation; Ideal gas model; Mach number; Mechanical Ventilation; VanDer Waals model; Venturi´s pipe; absolute pressure;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1403598
Filename
1403598
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