• DocumentCode
    2730775
  • Title

    The leaky surface wave in SiO2/49° Y-X LiNbO3 structure

  • Author

    Jiang, Z.L. ; Wu, W.Q. ; Shui, Y.A. ; Yin, J.H.

  • Author_Institution
    Inst. of Acoust., Nanjing Univ., China
  • fYear
    1989
  • fDate
    3-6 Oct 1989
  • Firstpage
    295
  • Abstract
    The leaky surface wave characteristics in SiO2/49° Y-X LiNbO3 are investigated. Within the range 0<kh<0.5 the attenuation of LSW is very small, close to 0. When interdigital transducers (IDTs) are in the interface, K2 (the electromechanical coupling constant) will increase as kdh (film thickness normalized to wavelength) increases. The maximum K2 is 15%, i.e. about 1.08 times as large as the electromechanical coupling coefficient at zero film thickness. Several zero TCD (temperature coefficient of delay) points exist for the SiO2/49° Y-X LiNbO 3 structure. In the range -40°C<T<60°C, TCD changes less than 4 p.p.m
  • Keywords
    lithium compounds; losses; silicon compounds; surface acoustic waves; ultrasonic propagation; -40 to 60 C; IDT; LSW attenuation; SAW; SiO2-LiNbO3; SiO2-LiNbO3 structure; TCD; electromechanical coupling constant; film thickness; interdigital transducers; leaky surface wave characteristics; surface acoustic waves; temperature coefficient of delay; Attenuation; Boundary conditions; Consumer electronics; Military communication; Military equipment; Propagation losses; Radar signal processing; Storage area networks; Surface waves; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
  • Conference_Location
    Montreal, Que.
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1989.66998
  • Filename
    66998
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2730775