• DocumentCode
    2731405
  • Title

    Improving FPGA Design Robustness with Partial TMR

  • Author

    Pratt, Brian ; Caffrey, Michael ; Graham, Paul ; Morgan, Keith ; Wirthlin, Michael

  • Author_Institution
    Dept. of Energy, Los Alamos Nat. Lab.
  • fYear
    2006
  • fDate
    26-30 March 2006
  • Firstpage
    226
  • Lastpage
    232
  • Abstract
    This paper describes an efficient approach of applying mitigation to an FPGA design to protect against single event upsets (SEUs). This approach applies mitigation selectively to FPGA circuit structures depending on their importance within the design. Higher priority is given to structures causing "persistent" errors within the design. For certain applications, applying selective mitigation to the persistent components can yield higher returns in reliability per unit cost than full mitigation. A software tool is also introduced which automatically classifies circuit structures based on this concept and applies triple modular redundancy (TMR) selectively based on the classification of the circuit structure
  • Keywords
    field programmable gate arrays; integrated circuit reliability; logic design; radiation effects; redundancy; FPGA design robustness; circuit structures; classification; error propagation; reliability; selective mitigation; single event upsets; software tool; triple modular redundancy; Application software; Circuits; Costs; Field programmable gate arrays; Protection; Redundancy; Robustness; Single event transient; Single event upset; Software tools; FPGA; SEU; TMR; error propagation; persistence; radiation; selective mitigation; simulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-9498-4
  • Electronic_ISBN
    0-7803-9499-2
  • Type

    conf

  • DOI
    10.1109/RELPHY.2006.251221
  • Filename
    4017162