DocumentCode :
2731405
Title :
Improving FPGA Design Robustness with Partial TMR
Author :
Pratt, Brian ; Caffrey, Michael ; Graham, Paul ; Morgan, Keith ; Wirthlin, Michael
Author_Institution :
Dept. of Energy, Los Alamos Nat. Lab.
fYear :
2006
fDate :
26-30 March 2006
Firstpage :
226
Lastpage :
232
Abstract :
This paper describes an efficient approach of applying mitigation to an FPGA design to protect against single event upsets (SEUs). This approach applies mitigation selectively to FPGA circuit structures depending on their importance within the design. Higher priority is given to structures causing "persistent" errors within the design. For certain applications, applying selective mitigation to the persistent components can yield higher returns in reliability per unit cost than full mitigation. A software tool is also introduced which automatically classifies circuit structures based on this concept and applies triple modular redundancy (TMR) selectively based on the classification of the circuit structure
Keywords :
field programmable gate arrays; integrated circuit reliability; logic design; radiation effects; redundancy; FPGA design robustness; circuit structures; classification; error propagation; reliability; selective mitigation; single event upsets; software tool; triple modular redundancy; Application software; Circuits; Costs; Field programmable gate arrays; Protection; Redundancy; Robustness; Single event transient; Single event upset; Software tools; FPGA; SEU; TMR; error propagation; persistence; radiation; selective mitigation; simulator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
Type :
conf
DOI :
10.1109/RELPHY.2006.251221
Filename :
4017162
Link To Document :
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