• DocumentCode
    2731526
  • Title

    Self-assembly technology for reconfigured wafer-to-wafer 3D integration

  • Author

    Fukushima, T. ; Iwata, E. ; Lee, K. -W ; Tanaka, T. ; Koyanagi, M.

  • Author_Institution
    Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    1050
  • Lastpage
    1055
  • Abstract
    We have introduced a new 3D stacking technology called reconfigured wafer-to-wafer 3D integration using surface tension-powered multichip self-assembly and multichip transfer techniques. Many Si chips were simultaneously self-assembled to a carrier wafer named “reconfigured wafer”. High-precision chip alignment with sub-micron-scale accuracy can be realized by optimizing self-assembly conditions. In addition, we developed a new self-assembled multichip bonder to three-dimensionally stack many known good dies (KDGs) on 8-inch wafers at the wafer level. By using the equipment, the many self-assembled Si chips were transferred to another target wafer in batch.
  • Keywords
    Assembly; Fabrication; Large scale integration; Production; Self-assembly; Stacking; Three-dimensional integrated circuits; Throughput; Wafer bonding; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490830
  • Filename
    5490830