• DocumentCode
    2731676
  • Title

    Transaction Isolation and Lazy Commit

  • Author

    Kathuria, Vishal ; Dhamankar, Robin ; Kodavalla, Hanuma

  • Author_Institution
    Microsoft Corp., Redmond, WA
  • fYear
    2007
  • fDate
    15-20 April 2007
  • Firstpage
    1204
  • Lastpage
    1211
  • Abstract
    In order to guarantee durability of transactions (D in the ACID properties) database systems issue a synchronous log write on transaction commit. However, in many scenarios such as queue processing and personal information management systems, durability on commit is not required as the transactions rolled back due to a crash can be reprocessed using the application state. Avoiding such synchronous I/O improves system throughput and response time. Also, when the database is running on a mobile device or a laptop, reduced I/O consumes less power and increases battery life - a significant consideration for mobile users. Transactions that do not require durability can be "lazily committed", i.e. the log is not written synchronously upon commit. If another transaction reads such lazily committed data and performs an independently committed external action based on it, then an inconsistency may result if the effects of the lazily committed transaction are lost in a crash. We present a solution that provides the efficiency of lazily committed transactions and the flexibility for other transactions to read only durably committed data. We demonstrate that even in the presence of a large number of readers requesting durably committed data our approach reduces I/Os significantly.
  • Keywords
    database management systems; transaction processing; database systems; lazily committed transactions; transaction commit; transaction isolation; Batteries; Computer crashes; Database systems; Delay; Information management; Portable computers; Software systems; Throughput; Transaction databases; Warehousing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Engineering, 2007. ICDE 2007. IEEE 23rd International Conference on
  • Conference_Location
    Istanbul
  • Print_ISBN
    1-4244-0802-4
  • Electronic_ISBN
    1-4244-0803-2
  • Type

    conf

  • DOI
    10.1109/ICDE.2007.368979
  • Filename
    4221769