DocumentCode :
2731978
Title :
Reliability-Based MEMS System Modeling and Optimization
Author :
Liu, Nan ; Manoochehri, Souran
Author_Institution :
Dept. of Mech. Eng., Stevens Inst. of Technol., Hoboken, NJ
fYear :
2006
fDate :
26-30 March 2006
Firstpage :
403
Lastpage :
409
Abstract :
A methodology for reliability-based system modeling, analysis and optimization design of micro-electromechanical systems (MEMS) is presented that accounts for stochastic variations in device geometry parameters and operating conditions. The optimization objective function considers minimization of several uncertainty factors related to the overall system performance while satisfying target requirements specified. A probabilistic sufficiency factor approach is proposed in the form of constraints on micro-fabrication processes and materials system that combine safety factor and probability of failure. The design problem is decomposed into two analysis systems; uncertainty effects analysis and performance sensitivity analysis. Each analysis system can be partitioned into several subsystems according to the different functions they perform. The entire problem has been treated as a multi-disciplinary design optimization (MDO) for maximum robustness and performance achievement. The probabilistic sufficiency factor approach represents a factor of safety relative to a target probability of failure. It is known that the use of probabilistic sufficiency factor as a design constraint boundary is much more accurate and reasonable, and this accelerates the convergence of reliability-based design optimization. In this study, the analysis results are provided as optimized device geometry parameters governing the resonant frequency and the trans-conductance values for the example of a selected micro-resonator device
Keywords :
micromechanical resonators; minimisation; reliability; MEMS design; device geometry parameters; microresonator device; minimization; multidisciplinary design optimization; performance sensitivity analysis; probabilistic sufficiency factor; reliability; resonant frequency; stochastic variations; system modeling; trans conductance values; uncertainty effects analysis; uncertainty factors; Design optimization; Information geometry; Microelectromechanical systems; Micromechanical devices; Modeling; Performance analysis; Safety; Stochastic systems; System performance; Uncertainty; MEMS design; Optimization; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
Type :
conf
DOI :
10.1109/RELPHY.2006.251252
Filename :
4017193
Link To Document :
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