Title :
Vertically aligned carbon nanotubes for thermal interface materials: Quality control, alignment improvement and laser flash measurement
Author :
Lin, Wei ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Thermal interface materials based on vertically aligned carbon nanotubes were measured systematically by a laser flash technique. An important modification has been made to the sample structure for the laser flash measurement. Influences of carbon nanotube quality, tip entanglement, alignment and packing density on the overall thermal resistance were discussed.
Keywords :
Carbon nanotubes; Contact resistance; Electrical resistance measurement; Optical materials; Organic materials; Phased arrays; Quality control; Silicon; Thermal conductivity; Thermal resistance;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490863