Near-field sounding of multilayered media

Author

Gaikovich, Peter K.

Author_Institution

Inst. for Phys. of Microstructures, RAS, Nizhny Novgorod, Russia

fYear

2009

fDate

June 28 2009-July 2 2009

Firstpage

1

Lastpage

4

Abstract

A method of the coherent near-field sounding of layers´ parameters of a multilayered dielectric is proposed. It is based on the field measurements with the use of subwavelength probes (emitting and receiving) that are spaced above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers´ depth. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.

Keywords

acoustic wave effects; dielectric materials; multilayers; near-field scanning optical microscopy; SNOM techniques; coherent near-field sounding; multilayered dielectric; multilayered heterostructures; multilayered media; subwavelength probes; subwavelength resolution; Dielectric measurements; Epitaxial growth; Green function; Impedance; Interferometry; Microstructure; Monitoring; Nonhomogeneous media; Physics; Probes; dielectric; multilayered structures; near-field sounding;

fLanguage

English

Publisher

ieee

Conference_Titel

Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on

Conference_Location

Azores

Print_ISBN

978-1-4244-4825-8

Electronic_ISBN

978-1-4244-4827-2

Type

conf

DOI

10.1109/ICTON.2009.5185299

Filename

5185299