DocumentCode
2732329
Title
Fine-pitch, cost effective flip chip package development: TAB-BGA
Author
Park, Soojeoung ; Jo, Sanggui ; Park, Jiyong ; Kim, Hyonchol ; Bae, Kawngjin ; Kim, Chulwoo ; Choi, Kyoungsei ; Kang, Sayoon
Author_Institution
Syst. LSI Div., Samsung Electron. Co., Yongin, South Korea
fYear
2010
fDate
1-4 June 2010
Firstpage
20
Lastpage
24
Abstract
This paper presents a cost effective fine-pitch flip chip solution to meet the increasing demand for the high performance small form factor packages. Tape Automated Bonding (TAB)-BGA package utilizes thermo-compression to bond a flip chip onto a film based substrate instead of reflow soldering. This approach allows for fine-pitch connection that can save significant substrate area, which can be especially cost effective for some package designs that can reduce the conductive layer count from 2 to 1 [1]. For second level interconnects, typical BGA approach was taken for easy adoption. Successfully implementing TAB-BGA has several technical challenges. Applying underfill under the fine-pitch flip chip without creating voids can be difficult. One way to overcome this challenge is by using no filler underfill and overmold type flip chip; however, that can potentially lead to high water absorption rate and delamination issues. Furthermore, board level reliability, especially temperature cycle, can have high failure rate for this type of single layer package structure [2]. To overcome these challenges, flexible PI film based substrate has been used to reduce the residual stress within the package. In addition, Epoxy Molding Compound (EMC) with low modulus at high temperature and solder resist stress buffer layer have been applied to improve the package and board level reliability.
Keywords
Absorption; Bonding; Costs; Flip chip; Lead; Packaging; Reflow soldering; Residual stresses; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490879
Filename
5490879
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