Title :
Finite element analysis of dispersion characteristics of microstrip lines lying near substrate and ground plane edges
Author :
Crain, Bruce R. ; Peterson, Andrew F.
Author_Institution :
Lockheed Martin Aeronaut. Syst., Marietta, GA, USA
Abstract :
The dispersion characteristics of microstrip lines lying near substrate and ground plane edges are examined using the finite element method (FEM). Microstrips lying near two types of edges are analyzed: a substrate edge on an infinite ground plane and a substrate/ground plane edge. The FEM formulation is based on the curl-curl vector Helmholtz equation. Mixed-order covariant projection finite elements are employed to avoid problems with spurious modes. Local absorbing boundary conditions are used to truncate the FEM mesh in the open region. An efficient sparse eigensolver, based on iterative methods, is used to solve the resulting non-linear eigenvalue equation
Keywords :
Helmholtz equations; MMIC; dispersion (wave); eigenvalues and eigenfunctions; finite element analysis; iterative methods; microstrip lines; printed circuits; transmission line theory; FEM; curl-curl vector Helmholtz equation; dispersion characteristics; finite element analysis; ground plane edges; iterative methods; local absorbing boundary conditions; microstrip lines; mixed-order covariant projection finite elements; nonlinear eigenvalue equation; sparse eigensolver; substrate edges; Boundary conditions; Dielectric materials; Dielectric substrates; Eigenvalues and eigenfunctions; Electromagnetic waveguides; Finite element methods; Geometry; MMICs; Microstrip; Nonlinear equations;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561410
