DocumentCode :
2732610
Title :
Thermal baffling of batteries in a simulated optical network unit: thermal design and analysis
Author :
Estes, R.C. ; Kimsey, R. ; Kimsey, T.H. ; Taylor, T.M.
Author_Institution :
Bellcore, Morristown, NJ, USA
fYear :
1990
fDate :
22-25 Oct. 1990
Firstpage :
577
Lastpage :
583
Abstract :
A local powering method for the optical network unit (ONU) is considered in which commercial AC is used to power the ONU normally and batteries located in the ONU provide back-up power during power outages. Because batteries are such an integral part of this scheme, its success depends critically on the cost, reliability, and life expectancies of the batteries. The authors describe a ´thermal baffling´ technique, in which a barrier is used to buffer the batteries from the heat of the ONU electronics. This technique is currently being used in 10 simulated ONUs that are part of a Bellcore field demonstration. A technique for quantifying the benefits of temperature control on battery life is presented and used to develop a temperature design criterion for the simulated ONUs. A thermal model for a generic ONU enclosure with a thermal baffle is presented, and results from the model are compared with experimental data from a simulated ONU. Finally, initial data from the field demonstration are presented and discussed.<>
Keywords :
cooling; design engineering; economics; heat sinks; optical links; reliability; secondary cells; thermal analysis; uninterruptible power supplies; back-up power; batteries; cost; design; heat sinks; life; model; optical links; optical network unit; power outages; power supplies; reliability; temperature control; thermal analysis; thermal baffling; Analytical models; Batteries; Costs; Intelligent networks; Optical buffering; Optical design; Optical fiber devices; Optical network units; Power system reliability; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telecommunications Energy Conference, 1990. INTELEC '90., 12th International
Conference_Location :
Orlando, FL, USA
Type :
conf
DOI :
10.1109/INTLEC.1990.171307
Filename :
171307
Link To Document :
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