Title :
Acceptance testing of BGA ball alloys
Author :
Allen, Aileen ; Henshall, Gregory ; Troxel, Kris ; Miremadi, Jian ; Benedetto, Elizabeth ; Holder, Helen ; Roesch, Michael
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
The industry has seen the development of a wide range of new Pb-free BGA ball alloys. A significant element of uncertainty regarding these new alloys is the lack of defined data requirements for alloy acceptance. This paper describes recent efforts at Hewlett-Packard to develop Pb-free solder alloy testing requirements. To facilitate the standardization of alloy testing, the required tests are divided into three major areas. • Material properties • Solder joint reliability • Impact to manufacturing processes This paper presents the approach to assess the risk of using new Pb-free BGA ball alloys on printed circuit assemblies.
Keywords :
Assembly; Circuit testing; Manufacturing processes; Material properties; Materials reliability; Materials testing; Printed circuits; Soldering; Standardization; Uncertainty;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490903