Title :
A multiwavelet model for 2D object analysis and classification
Author :
Paulik, M.J. ; Wang, Y.D.
Author_Institution :
Dept. of Electr. Eng., Detroit Univ., MI, USA
Abstract :
A multiwavelet based model utilizing the GHM scaling and wavelet functions has been developed for object classification. Multiwavelets are employed as they possess such important properties as orthogonality, symmetry, and compact support, which cannot be achieved simultaneously with scalar wavelet analysis. Additionally, multiwavelets allow the use of two or more inputs concurrently. In the context of shape analysis this permits modeling both coordinates of an object contour sequence. All these properties make multiwavelets an idea tool for object analysis and classification. The proposed algorithm is invariant to change in scaling, shifting, rotation, and starting point. The scaling function expansion coefficients, which contain maximum energy, are used as features for object classification. Experimental results demonstrate the model´s efficacy
Keywords :
image classification; object recognition; wavelet transforms; 2D object analysis; 2D object classification; GHM scaling; multiwavelet model; object contour sequence; orthogonality; scaling function expansion coefficients; shape analysis; symmetry; wavelet functions; Context modeling; Electrical capacitance tomography; Energy resolution; Fourier transforms; Image coding; Signal analysis; Signal processing; Signal processing algorithms; Signal resolution; Wavelet analysis;
Conference_Titel :
Circuits and Systems, 1998. Proceedings. 1998 Midwest Symposium on
Conference_Location :
Notre Dame, IN
Print_ISBN :
0-8186-8914-5
DOI :
10.1109/MWSCAS.1998.759511