DocumentCode :
2732729
Title :
Mechanical analysis and reliability enhancement of a Proximity Communication flip chip package
Author :
Guenin, Bruce ; Shi, Jing
Author_Institution :
Oracle, San Diego, CA, USA
fYear :
2010
fDate :
1-4 June 2010
Firstpage :
194
Lastpage :
199
Abstract :
Proximity Communication is a technology that enables high-bandwidth chip-to-chip signaling using dense arrays of metal pads that are capacitively coupled to the corresponding pads on the neighboring chip. To successfully deploy Proximity Communication requires limiting chip x-y misalignment and separation to be less than 8 µm and maintaining these tolerances over many temperature cycles. This paper examines these requirements in light of test results and detailed mechanical modeling to both understand the performance of existing package designs and to identify design modifications that lead to improved performance.
Keywords :
Assembly; Bonding; Bridge circuits; Circuit testing; Flip chip; Packaging machines; Semiconductor device measurement; Temperature distribution; Temperature sensors; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2010.5490905
Filename :
5490905
Link To Document :
بازگشت