• DocumentCode
    2732865
  • Title

    Development and reliability of ultra-thin chip on plastic bonding for flexible liquid crystal displays

  • Author

    Huang, Yu-Wei ; Lu, Su-Tsai

  • Author_Institution
    Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    575
  • Lastpage
    580
  • Abstract
    The development of portable and flexible liquid crystal displays (LCDs) has led to a change in the substrate panel material. In the driver integrated circuit (IC) packaging process, ultra-thin chip on plastic (UTCOP) bonding is required to impart flexibility to plastic LCDs. In his study, the performance of 50-μm-thick ultra-thin chips on transparent polyimide (PI) substrate was investigated. To study the temperature distribution effect of bonding structures on the contact resistance during the anisotropic conductive adhesive (ACA) bonding process, three kinds of structures were evaluated: (1) a chip thickness of 670 μm, (2) a chip thickness of 50 μm, and (3) a 50-μm-thick chip with a 420-μm carrier IC of attached by thermo-release film. To determine the relationship between daisy-chain resistance and ACA-chip interface temperature, in-situ daisy-chain resistance and temperature during the bonding process were measured. The effect of the bonding structures on the UTCOP temperature distribution was analyzed using 3-D finite element (FE) modeling. The reliability of UTCOP was evaluated by thermal humidity storage testing (THST) at 85°C and 85% RH, thermal cycle testing (TCT) from −55°C to 125°C, and static bending testing at 10 mm radius of curvature. Scanning electron microscopy (SEM) cross sections of ACA joints and profiles of chip backs after bonding were analyzed to determine the failure reasons. Our results indicate that the temperature distribution of the bonding structure affected the electrical conductivity and reliability of the ACA joints. Structures with the lowest thermal conductivity had the best electrical contact resistance and reliability because that the structure-induced temperature distribution affects the ACA flow during bonding process. Optimizing this process made it possible to develop a highly reliable UTCOP assembly with ACA interconnections, greatly enhancing its potenti- - al for use in flexible LCDs in the near future.
  • Keywords
    Bonding processes; Contact resistance; Liquid crystal displays; Plastics; Scanning electron microscopy; Substrates; Temperature distribution; Testing; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490912
  • Filename
    5490912