DocumentCode
2732865
Title
Development and reliability of ultra-thin chip on plastic bonding for flexible liquid crystal displays
Author
Huang, Yu-Wei ; Lu, Su-Tsai
Author_Institution
Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear
2010
fDate
1-4 June 2010
Firstpage
575
Lastpage
580
Abstract
The development of portable and flexible liquid crystal displays (LCDs) has led to a change in the substrate panel material. In the driver integrated circuit (IC) packaging process, ultra-thin chip on plastic (UTCOP) bonding is required to impart flexibility to plastic LCDs. In his study, the performance of 50-μm-thick ultra-thin chips on transparent polyimide (PI) substrate was investigated. To study the temperature distribution effect of bonding structures on the contact resistance during the anisotropic conductive adhesive (ACA) bonding process, three kinds of structures were evaluated: (1) a chip thickness of 670 μm, (2) a chip thickness of 50 μm, and (3) a 50-μm-thick chip with a 420-μm carrier IC of attached by thermo-release film. To determine the relationship between daisy-chain resistance and ACA-chip interface temperature, in-situ daisy-chain resistance and temperature during the bonding process were measured. The effect of the bonding structures on the UTCOP temperature distribution was analyzed using 3-D finite element (FE) modeling. The reliability of UTCOP was evaluated by thermal humidity storage testing (THST) at 85°C and 85% RH, thermal cycle testing (TCT) from −55°C to 125°C, and static bending testing at 10 mm radius of curvature. Scanning electron microscopy (SEM) cross sections of ACA joints and profiles of chip backs after bonding were analyzed to determine the failure reasons. Our results indicate that the temperature distribution of the bonding structure affected the electrical conductivity and reliability of the ACA joints. Structures with the lowest thermal conductivity had the best electrical contact resistance and reliability because that the structure-induced temperature distribution affects the ACA flow during bonding process. Optimizing this process made it possible to develop a highly reliable UTCOP assembly with ACA interconnections, greatly enhancing its potenti- - al for use in flexible LCDs in the near future.
Keywords
Bonding processes; Contact resistance; Liquid crystal displays; Plastics; Scanning electron microscopy; Substrates; Temperature distribution; Testing; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490912
Filename
5490912
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