Title :
Infrared Ray Emission (IREM) Based Post-Silicon Power Debug Flows Developed for Chip Power Performance
Author :
Chen, Yuan-Chuan Steven ; Lu, Daniel ; Bockelman, Dan ; Ma, Matthew ; Wan, Ifar
Author_Institution :
Intel Corp.
Abstract :
Pre-silicon power modeling, post-silicon power validation, and power debugs design efforts have significantly increased to meet speed performance, reliability deliverables and design robustness for manufacturing. IREM based power debug flow has been developed to isolate marginal circuits with excessive static and dynamic power consumption. Three root cause analysis cases are presented to demonstrate the success of this novel post-silicon debug flow
Keywords :
design for manufacture; integrated circuit manufacture; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; microprocessor chips; IREM; chip power performance; infrared ray emission; marginal circuits isolation; post-silicon power debug flows; post-silicon power validation; power debugs design; root cause analysis; CMOS technology; Circuit simulation; Circuit testing; Computer bugs; Design methodology; Design optimization; Failure analysis; Microprocessors; Robustness; Silicon;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
DOI :
10.1109/RELPHY.2006.251301
