DocumentCode
2732968
Title
Checkpoint Extraction Using Execution Traces for Intra-task DVFS in Embedded Systems
Author
Tatematsu, Tomohiro ; Takase, Hideki ; Zeng, Gang ; Tomiyama, Hiroyuki ; Takada, Hiroaki
Author_Institution
Grad. Sch. of Inf. Sci., Nagoya Univ., Nagoya, Japan
fYear
2011
fDate
17-19 Jan. 2011
Firstpage
19
Lastpage
24
Abstract
It is important to estimate accurately the remaining worst case execution cycles in a program to improve the effect that intra-task dynamic voltage and frequency scaling (DVFS) has on energy reduction. Since checkpoints for DVFS involve execution time and energy overhead, it is necessary to calculate where those checkpoints should be inserted in the program and the processor frequency at each execution path. To address this issue, we propose the use of execution trace mining to extract the initial checkpoint candidates. Moreover, we introduce a greedy algorithm to further select the checkpoints with highest energy reduction efficiency. Experimental results using Media Bench tests validate the effectiveness of our method.
Keywords
embedded systems; microprocessor chips; checkpoint extraction; frequency scaling; intratask dynamic voltage; processor frequency; worst case execution cycles; Data mining; Embedded systems; Energy consumption; Equations; Greedy algorithms; Mathematical model; Time frequency analysis; DVFS; embedded system; execution trace; low energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Application (DELTA), 2011 Sixth IEEE International Symposium on
Conference_Location
Queenstown
Print_ISBN
978-1-4244-9357-9
Type
conf
DOI
10.1109/DELTA.2011.13
Filename
5729533
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