DocumentCode
2732983
Title
Surface Transportation of Chemical Species in Spray-Cleaning and Gate Oxide Integrity
Author
Sheng, Lieyi ; De Backer, E. ; Verpoort, Philippe ; De Greve, J.
Author_Institution
AMI Semicond., Oudenaarde
fYear
2006
fDate
26-30 March 2006
Firstpage
649
Lastpage
650
Abstract
Centrifugal spray process technology provides a cost-effective and environment-friendly wafer-cleaning solution, and has been considered a good alternative to "wet bench" cleans according to K. K. Christenson (1997), and E. Olson and B. J. Palla (2004). Spray tools use centrifugal force to transfer fresh chemicals or rinse water onto and to eject reaction products and unused reactants from the wafer surface. Knowing the extreme difficulties in quantifying the many aspects in such a dynamic and complex system, experimental demonstrations of the mass transportation along wafer surface and its impacts on critical cleanings become more practical and important
Keywords
spraying; surface cleaning; centrifugal spray process; chemical species surface transportation; critical cleaning; failure patterns; gate oxide integrity; mass transportation; spray cleaning; wafer cleaning; wafer surface; Capacitors; Chemical technology; Cleaning; Clocks; Microscopy; Pollution measurement; Silicon; Spraying; Surface contamination; Transportation; Spray-cleaning; failure patterns; gate oxide integrity; surface transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location
San Jose, CA
Print_ISBN
0-7803-9498-4
Electronic_ISBN
0-7803-9499-2
Type
conf
DOI
10.1109/RELPHY.2006.251306
Filename
4017247
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