DocumentCode :
2732983
Title :
Surface Transportation of Chemical Species in Spray-Cleaning and Gate Oxide Integrity
Author :
Sheng, Lieyi ; De Backer, E. ; Verpoort, Philippe ; De Greve, J.
Author_Institution :
AMI Semicond., Oudenaarde
fYear :
2006
fDate :
26-30 March 2006
Firstpage :
649
Lastpage :
650
Abstract :
Centrifugal spray process technology provides a cost-effective and environment-friendly wafer-cleaning solution, and has been considered a good alternative to "wet bench" cleans according to K. K. Christenson (1997), and E. Olson and B. J. Palla (2004). Spray tools use centrifugal force to transfer fresh chemicals or rinse water onto and to eject reaction products and unused reactants from the wafer surface. Knowing the extreme difficulties in quantifying the many aspects in such a dynamic and complex system, experimental demonstrations of the mass transportation along wafer surface and its impacts on critical cleanings become more practical and important
Keywords :
spraying; surface cleaning; centrifugal spray process; chemical species surface transportation; critical cleaning; failure patterns; gate oxide integrity; mass transportation; spray cleaning; wafer cleaning; wafer surface; Capacitors; Chemical technology; Cleaning; Clocks; Microscopy; Pollution measurement; Silicon; Spraying; Surface contamination; Transportation; Spray-cleaning; failure patterns; gate oxide integrity; surface transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
Type :
conf
DOI :
10.1109/RELPHY.2006.251306
Filename :
4017247
Link To Document :
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