Title :
Surface Transportation of Chemical Species in Spray-Cleaning and Gate Oxide Integrity
Author :
Sheng, Lieyi ; De Backer, E. ; Verpoort, Philippe ; De Greve, J.
Author_Institution :
AMI Semicond., Oudenaarde
Abstract :
Centrifugal spray process technology provides a cost-effective and environment-friendly wafer-cleaning solution, and has been considered a good alternative to "wet bench" cleans according to K. K. Christenson (1997), and E. Olson and B. J. Palla (2004). Spray tools use centrifugal force to transfer fresh chemicals or rinse water onto and to eject reaction products and unused reactants from the wafer surface. Knowing the extreme difficulties in quantifying the many aspects in such a dynamic and complex system, experimental demonstrations of the mass transportation along wafer surface and its impacts on critical cleanings become more practical and important
Keywords :
spraying; surface cleaning; centrifugal spray process; chemical species surface transportation; critical cleaning; failure patterns; gate oxide integrity; mass transportation; spray cleaning; wafer cleaning; wafer surface; Capacitors; Chemical technology; Cleaning; Clocks; Microscopy; Pollution measurement; Silicon; Spraying; Surface contamination; Transportation; Spray-cleaning; failure patterns; gate oxide integrity; surface transportation;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
DOI :
10.1109/RELPHY.2006.251306