• DocumentCode
    2732983
  • Title

    Surface Transportation of Chemical Species in Spray-Cleaning and Gate Oxide Integrity

  • Author

    Sheng, Lieyi ; De Backer, E. ; Verpoort, Philippe ; De Greve, J.

  • Author_Institution
    AMI Semicond., Oudenaarde
  • fYear
    2006
  • fDate
    26-30 March 2006
  • Firstpage
    649
  • Lastpage
    650
  • Abstract
    Centrifugal spray process technology provides a cost-effective and environment-friendly wafer-cleaning solution, and has been considered a good alternative to "wet bench" cleans according to K. K. Christenson (1997), and E. Olson and B. J. Palla (2004). Spray tools use centrifugal force to transfer fresh chemicals or rinse water onto and to eject reaction products and unused reactants from the wafer surface. Knowing the extreme difficulties in quantifying the many aspects in such a dynamic and complex system, experimental demonstrations of the mass transportation along wafer surface and its impacts on critical cleanings become more practical and important
  • Keywords
    spraying; surface cleaning; centrifugal spray process; chemical species surface transportation; critical cleaning; failure patterns; gate oxide integrity; mass transportation; spray cleaning; wafer cleaning; wafer surface; Capacitors; Chemical technology; Cleaning; Clocks; Microscopy; Pollution measurement; Silicon; Spraying; Surface contamination; Transportation; Spray-cleaning; failure patterns; gate oxide integrity; surface transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-9498-4
  • Electronic_ISBN
    0-7803-9499-2
  • Type

    conf

  • DOI
    10.1109/RELPHY.2006.251306
  • Filename
    4017247