DocumentCode
2733082
Title
Monte Carlo simulation of InGaAs/InAlAs HEMTs with a quantum correction potential
Author
Wu, Bo ; Tang, Ting-wei
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fYear
2002
fDate
6-8 Aug. 2002
Firstpage
233
Lastpage
239
Abstract
In Monte Carlo simulation of high electron mobility transistors (HEMTs), how to position the source and drain contacts will significantly affect the drain current. Unlike many Monte Carlo (MC) simulations of HEMTs in the past, in this work, the source and drain contacts are placed on the top of the caps as in the real device instead of on the side adjacent to the channel. In addition, to taking the quantum effects into consideration, the effective potential approach of quantum correction has been incorporated into our MC simulator. We have found that the simulated drain current is substantially increased compared to that of using the classical potential.
Keywords
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; quantum theory; semiconductor device models; InGaAs-InAlAs; InGaAs/InAlAs HEMTs; Monte Carlo simulation; drain contacts; drain current; effective potential approach; quantum correction potential; quantum effects; source contacts; Doping; Electrons; HEMTs; High definition video; Indium compounds; Indium gallium arsenide; MODFETs; Monte Carlo methods; Ohmic contacts; Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on
Print_ISBN
0-7803-7478-9
Type
conf
DOI
10.1109/LECHPD.2002.1146756
Filename
1146756
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