• DocumentCode
    2733082
  • Title

    Monte Carlo simulation of InGaAs/InAlAs HEMTs with a quantum correction potential

  • Author

    Wu, Bo ; Tang, Ting-wei

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • fYear
    2002
  • fDate
    6-8 Aug. 2002
  • Firstpage
    233
  • Lastpage
    239
  • Abstract
    In Monte Carlo simulation of high electron mobility transistors (HEMTs), how to position the source and drain contacts will significantly affect the drain current. Unlike many Monte Carlo (MC) simulations of HEMTs in the past, in this work, the source and drain contacts are placed on the top of the caps as in the real device instead of on the side adjacent to the channel. In addition, to taking the quantum effects into consideration, the effective potential approach of quantum correction has been incorporated into our MC simulator. We have found that the simulated drain current is substantially increased compared to that of using the classical potential.
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; quantum theory; semiconductor device models; InGaAs-InAlAs; InGaAs/InAlAs HEMTs; Monte Carlo simulation; drain contacts; drain current; effective potential approach; quantum correction potential; quantum effects; source contacts; Doping; Electrons; HEMTs; High definition video; Indium compounds; Indium gallium arsenide; MODFETs; Monte Carlo methods; Ohmic contacts; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on
  • Print_ISBN
    0-7803-7478-9
  • Type

    conf

  • DOI
    10.1109/LECHPD.2002.1146756
  • Filename
    1146756