• DocumentCode
    2733188
  • Title

    ESD field coupling study in relation with PCB GND and metal chassis

  • Author

    Lee, Jong-Sung ; Pommerenke, David ; Lim, Jae-Deok ; Seol, Byong-Su

  • Author_Institution
    SamSung Electron. Manuf. Technol. R&D Center, Suwon
  • fYear
    2009
  • fDate
    12-16 Jan. 2009
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    This work demonstrates a simple experimental setup to measure ESD-induced voltage to traces on a printed circuit board when ESD current is injected directly onto the outside of a metal case and presents how the induced voltage can be affected by the physical structure of the PCB ground and the metal case. The correlation between ESD-induced voltage and the method of connecting the PCB and chassis grounds shall be discussed, as well as how the PCB ground fill affects ESD. These experimental results may provide guidance for a better design for ESD immunity.
  • Keywords
    electrostatic discharge; printed circuits; ESD current; ESD field coupling study; ESD-induced voltage; PCB ground; metal chassis; printed circuit board; Circuit testing; Coaxial cables; Computer aided manufacturing; Copper; Couplings; Electrostatic discharge; Joining processes; Oscilloscopes; Research and development; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-3-9523286-4-4
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2009.4783413
  • Filename
    4783413