DocumentCode :
2733195
Title :
Low temperature growth and characterization of silicon delta doped GaInP/GaInAs/GaAs pseudomorphic heterostructures for use in high electron mobility transistors
Author :
Smart, J.A. ; Chumbes, E.M. ; Eastman, L.F. ; Shealy, J.R.
Author_Institution :
OMVPE Fac., Cornell Univ., Ithaca, NY, USA
fYear :
1997
fDate :
8-11 Sep 1997
Firstpage :
91
Lastpage :
94
Abstract :
Flow modulation organometallic vapor phase epitaxy (OMVPE) was used to synthesize selectively doped GaInP/GaInAs/GaAs pseudomorphic heterostructures. Transport properties of the two dimensional electron gas (2DEG) were optimized with various buffer formation schemes, techniques for single sided doping, and the channel and spacer layer thicknesses. GaAs buffers were deposited at 550°C and 635°C, while GaInP layers were grown at 550°C to promote atomic disordering. Achieving high 2DEG densities involved incorporating several delta doping supply layers separated by thin GaInP regions. Mobilities as high as 5100 cm2 volt-1 sec-1 with associated 2DEG densities of 2.6×1012 cm -2 were obtained at room temperature. Effects of vicinal substrates on mobilities was determined with conduction paths parallel and perpendicular to steps seen in AFM images. Finally, RF results are presented on devices with 0.25 μm×100 μm gate geometry
Keywords :
III-V semiconductors; atomic force microscopy; electron density; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor doping; semiconductor growth; semiconductor heterojunctions; silicon; substrates; two-dimensional electron gas; vapour phase epitaxial growth; 2DEG; 550 degC; 635 degC; AFM images; GaAs buffers; GaInP layers; GaInP-GaInAs-GaAs; OMVPE; RF results; Si delta doped GaInP/GaInAs/GaAs pseudomorphic heterostructures; atomic disordering; buffer formation schemes; channel layer thickness; characterization; conduction paths; flow modulation organometallic vapor phase epitaxy; high electron mobility transistors; low temperature growth; mobilities; room temperature; single sided doping; spacer layer thickness; transport properties; two dimensional electron gas; vicinal substrates; Atomic layer deposition; Doping; Electrons; Epitaxial growth; Gallium arsenide; Phase modulation; Radio frequency; Silicon; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7503-0556-8
Type :
conf
DOI :
10.1109/ISCS.1998.711570
Filename :
711570
Link To Document :
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