DocumentCode
2733306
Title
Towards Reliable Simulation of Bounded Fan-in Boolean Circuits using Molecular Beacon
Author
Jianzhong, Cui ; Zhixiang, Yin ; Wei, Wang ; Xiaohong, Shi ; Linqiang, Pan
Author_Institution
Dept. of Math. & Phys., Anhui Univ. of Sci. & Technol., Huainan
Volume
1
fYear
0
fDate
0-0 0
Firstpage
3910
Lastpage
3914
Abstract
A fundamental concept in computer science is that of the universal Turing machine which is an abstract definition of a general purpose computer. It has also been shown that any computer which is able to simulate Boolean circuits of any complexity is such a general purpose computer. However, few studies have devoted to DNA computer of this kind. Molecular beacon is a hairpin-formed oligonucleotide probe, which can report the presence of target sequence in solution with higher specificity compared with linear probe. It is particularly useful when single base discrimination is desired in the process of hybridization underlying DNA computing. In this paper, molecular beacon is utilized to simulate logical AND and OR gates. Then we present simulating an instance of bounded fan-in Boolean circuit comprising of these gates in time proportional to the depth of the circuit. The purpose of this paper is to explore the possibility of reliably simulating Boolean circuits using molecular beacon
Keywords
Turing machines; biocomputing; circuit complexity; circuit simulation; logic circuits; logic design; logic gates; Boolean circuit simulation; DNA computing; Turing machine; bounded fan-in Boolean circuits; circuit complexity; general purpose computer; hairpin-formed oligonucleotide probe; logical AND gates; logical OR gates; molecular beacon; Biochemistry; Circuit simulation; Computational modeling; Computer simulation; DNA computing; Educational technology; Mathematics; Molecular computing; Probes; Turing machines; Boolean circuit; DNA computing; Molecular beacon;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location
Dalian
Print_ISBN
1-4244-0332-4
Type
conf
DOI
10.1109/WCICA.2006.1713105
Filename
1713105
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